Scanning NV as easy as AFM
Explore what you can measure
Static magnetic field imaging
Nanoscale magnetism is inherently weak and challenging to measure. The QSM combines optimized hardware with advanced measurement protocols, enabling rapid and quantitative imaging of weak magnetic domains as small as a few tens of nanometers.
Measurement modes: cw-ODMR and pulsed-ODMR, QuickODMR, iso-B, dual iso-B, quench
Imaging time-varying magnetic fields involves additional experimental complexity and often requires stringent scanning NV probe requirements. The QSM, in combination with our QST tips, masters this complexity and makes varying magnetic fields as simple to image as their static counterpart.
Measurement modes: Rabi, QuickRabi, T1/Relaxation, Current reconstruction mode
Sample: BiYIG
Is scanning NV imaging not enough? The QSM features extensive magnetic characterization modes beyond NV magnetometry. Alongside a Magneto-Optical-Kerr-Effect imaging line, it features a versatile PFM and MFM optical readout head based on a beam-bounce tapping mode scanning tip. All measurements can be performed on the same sample area empowering researchers with a comprehensive and flexible magnetometer.
Measurement modes: MOKE, MFM, PFM, KPFM
Curious how it all works?
Dive into the science behind NV centers and QSM, and learn how our Quantum Scanning Tips deliver industry-leading sensitivity. Then explore our NV image library to see the technology in action.
System description
At a glance
The QSM is a turnkey scanning NV microscope designed to unite user-friendliness with high performance.
From large megapixel images to high resolution, high sensitivity maps, the QSM is the right tool for the job. Delivering performance close to the shot noise limit, its flexible platform makes it a versatile tool for studying magnetic phenomena at the nanometer scale, from stray fields and vortices over domain boundaries to current densities.
System overview
Optics head
Scanning confocal optics for NV excitation and readout, scanning MOKE and widefield imaging
AFM stage
AFM head with manual 3D stage for microwave excitation for NV scanning probes
Magnet stage
Mechanical magnet or electro vectormagnet for biasing the NV and sample
Isolating enclosure
Temperature-stabilized and acoustically isolated enclosure with active vibration isolation. Reduces sample drift to a few nm/h
Closeup
NV customized optics compatible with multiple laser colors. Additional side view imaging for precise positioning of the antenna and the tip on the sample
Broad measurement range over >80 mT (microwave bandwidth 600 MHz - 6 GHz)
Large scanner footprint for flexible sample geometry
Stitching extends the 85 x 85 µm2 scanner range to cover feature sizes up to several millimeters
Custom DC and RF lines for manipulating sample properties
| SPM Scanner and Coarse Stage | |
| Sample Scanner | XYZ scanner range: 85 x 85 x 15 µm3 (closed-loop, 0.15 nm resolution) System noise z: <50 pm RMS (dependent on environment) |
| Coarse Stage | XYZ range 6 x 6 x 15 mm3 (100 nm resolution); Stitching with scanner movement possible |
| SPM Modes | Tuning fork based AFM mode, NV modes: photoluminescence, Iso-B, cw-ODMR, QuickODMR, pulsed protocols |
| Sample Size | 25 mm diameter, (up to 50 x 50 mm2 with custom holder) |
| Probe-Sample Drift Rate | <2 nm/h over 50 h in temperature stabilized housing |
| Imaging Modes | |
| NV Scanning | Magnetic spatial resolution: theoretical <10 nm; typical 25–70 nm; Magnetic sensitivity*: 0.5–3 µT/√Hz; Full B pixel rates up to 200 Hz |
| AFM Topography | Tip dependent: NV scanning probes ~1 nm (z), ~150 nm (xy); Akiyama probes (non NV) <1 nm (z), <30 nm (xy) |
| Confocal Fluorescence | Circular scanning range: 150 µm diameter; <1 µm imaging resolution @515 nm |
| Scanning pulsed measurements | ODMR, Rabi, Ramsey, Relaxometry and user-defined pulse sequences. |
| Additional | MOKE, MFM, PFM, KPFM |
| * Probe and protocol dependent: shot noise limit for DC sensitivity in cw-ODMR: better than 1.5 µT/√Hz, for pulsed ODMR better than 500 nT/√Hz | |
| Confocal Microscope Performance | |
| Microscope Objective | 50x magnification, NA=0.75, WD=5.2 mm, FOV=150 µm diameter; NV-band optimized and compatible with 515 nm, 575 nm and 637 nm |
| Optical Scanning Range | Circular aperture with 150 µm diameter FOV |
| Quantum Control Console | |
| Microwave Source | 0.6–6 GHz, up to 36 dBm (5 W), custom range and output power available on request; with NV Advanced Modes extension: AWG with 1.25 GS/s, 400 MHz bandwidth; Custom MW circuitry available on request |
| Light Source & Detection | 515 nm laser source (cw & pulsed control), >10 mW, <1.5 ns rise/fall time; SPAD module with high quantum efficiency |
| Vibration and Temperature Isolation | |
| Vibration Isolation | Active isolation 0.7–300 Hz, passive isolation above 300 Hz; Transmissibility <0.01 (-40 dB) above 10 Hz |
| Temperature Stabilization | <0.1°C temperature drift |